International Congress of Plant Pathology (ICPP), Lyon

11 Sep 23 Image

International Congress of Plant Pathology (ICPP), Lyon

Organized every five years on a different continent, this year’s ICPP brought together 2,500 people in Lyon, including several pathologists from GEVES.

It was an opportunity to meet the international scientific community and learn about the latest knowledge and technological advances most relevant to our core business.

GEVES presented its recent work, notably on knowledge of seed pests, the development of resistance tests and methods for detecting pathogens and insects. Through these projects on chickpea, sugar beet, oilseed rape and lettuce, GEVES is helping to combat various diseases.

You Might Also Like:
Focus on seed quality
Focus on the varieties expertise news
Workshop: Detection and identification of bruchids in seed samples
France calls for stronger protection of vine variety names
CTPS Connect, the new online tool for variety managers!